Each cantilever comes individually characterized with both spring constant and tip radius accurately measured
and an entry hole for counter and reference electrodes are integrated into the glass fluid cell
the RESP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types
Super Sharp Conductive Single Crystal Diamond Probes
12µm for Stainless Steel Diameter: 3
FIB4-200A 8 N/m Each cantilever comes individually characterized42N m, 320kHz, 10nm Tip Radius, 200nm Wide Spike @ 4m, Al Reflective Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS 42N m, 320kHz, 10nm Tip Radius, 200nm Wide Spike @ 4m, Al Reflective Coating High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 20: 1 at 4um from tip apex. Tip Geometry: High Aspect Ratio Tip Height: 10 15 Front Angle: 1. 2 0. 5 Back Angle: 1. 2 0. 5 Side Angle: 1. 2 0. 5 Tip