DT-CONTR AFM probes per pack:10 Representative CDMS-XY-1T Traceable Certificate (214KB

Representative CDMS-XY-1T Traceable Certificate (214KB PDF)

SHAPE Very Sharp for High Resolution Tip Height 17µm - From 15µm To 19µm Tip Setback 15µm - From 10µm To 20µm Tip Radius < 1nm Half Cone Angle 20°-25° along cantilever axis

UltraFine tips 5 115mm Superalloy 0

For most applications it is advisable to use freshly cleaved substrates

This model features a single sharp hydrophobic diamond-like carbon extratip at the apex of gold coated silicon etched probe

DT-CONTR AFM probes per pack:10 Representative CDMS-XY-1T Traceable Certificate (214KBDESCRIPTION DIAMOND COATED Probe, silicon cantilever for contact mode, detector side: Al coating