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This cross-sectional sample holder is designed to hold a wafer cross-section upright for edge inspection and it can be used on all microscopes
FIB tips should not be used in contact mode
New super sharp probe for highest resolution imaging on the most delicate and challenging samples
dicing metal and optical single crystals
I - 16030 SDS (116KB PDF)
JEOL 7000/6500 Stage Adapter for Pin Mounts 65A This cross-sectional sample holder isDESCRIPTION Fits JEOL SEM: 7800F 7601F 7600F 7100F 7000F 6700F 6500F iT300 Solid brass dovetail stage adapter for using standard 3. 2mm (1 8") pin mounts with the JEOL SEM's listed above. Can hold up to 5 standard 12. 7mm (1 2") pin stubs or one larger pin stub. JEOL 7000 6500 Stage Adapter for Pin Mounts Pin mount not included.
